- SEM basics and SEM microanalysis,
- TEM basics,
- TEM sample preparation,
- Electron diffraction,
- High Resolution Electron
Microscopy,
- Analytical Electron Microscopy,
- Orientation Imaging Microscopy,
- Quantitative characterization of
microstructure by EM methods (example: Ni-base superalloys),
- Identification of phases in
multiphase materials by EM methods (example: multilayered Ti -base
alloys),
- TEM studies of intermetallics,
new Al alloys, amorphous zirconium and Ni-base composites
- The Skill Path was attended by
37 participants from 11 countries.
- The programme of the School
consisted of 11 invited lectures which have been published in
School Proceedings.
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